Partneraktivitet: CIA-CT on industrial applications of Computed Tomography

08:30 - 09:00 Registration and light breakfast

09:00-09:10 Welcome and introduction by Venkata Nadimpalli, DTU Constructelcome and introduction by Venkata Nadimpalli, DTU Construct

09:10 - 09:50 CT analysis of additively manufactured orthopaedic implant structures
Paul Bills, Doctor, University of Huddersfield, Great Britain

With the growing clinical shift toward uncemented orthopaedic implants, ensuring reliable lattice structures is critical for achieving stable biological fixation.
Our work applies high‑resolution dimensional CT to verify the geometric fidelity and porosity of additively manufactured Ti6AL4V and PEEK lattices, parameters essential for osseointegration. CT‑derived metrics are then correlated with bone in‑growth potential, providing insight into design features that enhance fixation. In parallel, the same structural characteristics are evaluated for their influence on bacterial attachment, helping to map infection risk.
Together, these findings highlight the value of CT‑based assessment in balancing osseointegration performance with reduced infection‑related implant failure.

10:50 - 10:20 XCT performance : image quality and dimensional measurement accuracy in standardization
Anne-Françoise Obaton, Researcher in metrology for additive manufacturing, LNE, France

As additive manufacturing (AM) moves toward industrial series production of parts in critical sectors, compliance with geometric and dimensional specifications, within defined tolerances, must be demonstrated. AM enables highly complex geometries with internal structures, making X-ray Computed Tomography (XCT) an essential metrological tool. Although XCT lacks traceability, the growing need for metrology in AM series production implies standardized methodologies, including simplified approaches to measurement uncertainty.
This talk addresses XCT performance in terms of image quality and dimensional measurement accuracy within standardization to achieve this goal.

10:20 - 10:50 Coffee and networking break

10:50 - 11:20 Capabilities of AI for automated defect recognition in the X-Ray industry
Stephan Tschechne, Dr. Product Manager X-Ray, Carl Zeiss Industrielle Messtechnik GmbH, Germany

X-Ray technology plays a significant role in Non-Destructive Testing (NDT) of industrial parts across various sectors.
As the demand for speed, efficiency, and defect detection increases alongside growing part complexity, Artificial Intelligence (AI) solutions are becoming increasingly important.
This work examines the capabilities of AI in defect detection. It explores  AI solutions utilizing deep learning through case studies from diverse industry segments, highlighting their effectiveness and potential for enhancing NDT processes.

11:20 - 11:50 Inspection of drillcores with microCT
Sina Maria Baier Stegmaier, Research Engineer, DTU Physics

X‑ray microCT is a powerful, non‑destructive technique for examining drill cores, as it reveals their internal structure in 3D without cutting or altering the samples. It enables geoscientists to identify fractures, lithological boundaries, porosity features, and inclusions with high spatial resolution. The resulting datasets also support quantitative analysis—such as density variations or volume fractions—thereby improving geological interpretation. This work explores the application of X‑ray microCT for efficient core logging and highlights key requirements for advancing future applications.

11:50 - 12:50 Lunch and networking break

13:50 - 14:20 Hierarchical Multiscale X-ray Phase-Contrast Tomography: Achieving centimeter-scale context to nanoscale detail in a single optical setup
Nis Christian Gellert, Postdoc, DTU Physics

This presentation introduces a hierarchical multiscale X-ray phase-contrast tomography setup developed at DTU and implemented at the DanMAX beamline at MAX IV. The instrument enables imaging of centimeter-scale samples while resolving sub-micron and nanoscale structural details within the same optical configuration. Operating across the full DanMAX energy range (15–35 keV), the system combines a large field-of-view detector with multilayer Laue lenses to bridge the traditional trade-off between resolution and sample size. The approach enables acquisition of multiscale structural information from intact samples, providing both global context and fine internal features. The concept is compatible with higher-energy hard X-rays, making it suitable for dense materials such as minerals, rocks, and structural materials, while maintaining phase-contrast sensitivity for weakly absorbing biological specimens.

14:50 - 15:20 High throughput CT scanning for natural heritage
Carsten Gundlach, Senior Research Engineer, DTU Physics

15:20-15:30 Closing remarks